"Modeling and testing of interference faults in the nano NAND Flash memory."

Jin Zha, Xiaole Cui, Chung Len Lee (2012)

> Home

Details and statistics

DOI: 10.1109/DATE.2012.6176525

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/date/ZhaCL12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/date/ZhaCL12
Jin Zha, Xiaole Cui, Chung Len Lee:
Modeling and testing of interference faults in the nano NAND Flash memory. DATE 2012: 527-531

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.