"A Test Design Method for Floating Gate Defects (FGD) in Analog Integrated ..."

Michael Pronath, Helmut E. Graeb, Kurt Antreich (2002)

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DOI: 10.1109/DATE.2002.998252

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Michael Pronath, Helmut E. Graeb, Kurt Antreich:
A Test Design Method for Floating Gate Defects (FGD) in Analog Integrated Circuits. DATE 2002: 78-83

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