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"Low-cost high-accuracy variation characterization for nanoscale IC ..."
Zhijian Pan et al. (2018)
- Zhijian Pan, Miao Li, Jian Yao, Hong Lu, Zuochang Ye, Yanfeng Li, Yan Wang:
Low-cost high-accuracy variation characterization for nanoscale IC technologies via novel learning-based techniques. DATE 2018: 797-802
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