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ORCID"A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs."
Guilherme Cardoso Medeiros et al. (2020)
- Guilherme Cardoso Medeiros, Cemil Cem Gürsoy, Lizhou Wu, Moritz Fieback
, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui:
A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs. DATE 2020: 792-797
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