"Pattern Selection for Testing of Deep Sub-Micron Timing Defects."

Mango Chia-Tso Chao, Li-C. Wang, Kwang-Ting Cheng (2004)

Details and statistics

DOI: 10.1109/DATE.2004.1269033

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

a service of  Schloss Dagstuhl - Leibniz Center for Informatics