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"Analog Test Design with IDD Measurements for the Detection of Parametric ..."

Walter M. Lindermeir, Thomas J. Vogels, Helmut E. Graeb (1998)

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DOI: 10.1109/DATE.1998.655953

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/date/LindermeirVG98
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  persistent URL:
  - https://dblp.org/rec/conf/date/LindermeirVG98
Walter M. Lindermeir, Thomas J. Vogels, Helmut E. Graeb:
Analog Test Design with IDD Measurements for the Detection of Parametric and Catastrophic Faults. DATE 1998: 822-827

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