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"Bias Temperature Instability analysis of FinFET based SRAM cells."
Seyab Khan et al. (2014)
- Seyab Khan, Innocent Agbo, Said Hamdioui, Halil Kukner, Ben Kaczer, Praveen Raghavan, Francky Catthoor:
Bias Temperature Instability analysis of FinFET based SRAM cells. DATE 2014: 1-6
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