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"RESCUE: Interdependent Challenges of Reliability, Security and Quality in ..."

Maksim Jenihhin et al. (2020)

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DOI: 10.23919/DATE48585.2020.9116558

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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  dblp key:
  - conf/date/JenihhinHRKLSKH20
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  - https://dblp.org/rec/conf/date/JenihhinHRKLSKH20
Maksim Jenihhin, Said Hamdioui, Matteo Sonza Reorda, Milos Krstic, Peter Langendörfer, Christian Sauer, Anton Klotz, Michael Hübner, Jörg Nolte, Heinrich Theodor Vierhaus, Georgios N. Selimis, Dan Alexandrescu, Mottaqiallah Taouil, Geert Jan Schrijen, Jaan Raik, Luca Sterpone, Giovanni Squillero, Zoya Dyka:
RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems. DATE 2020: 388-393

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