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"Bit-Flipping Scan - A unified architecture for fault tolerance and offline ..."

Michael E. Imhof, Hans-Joachim Wunderlich (2014)

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DOI: 10.7873/DATE.2014.206

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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  dblp key:
  - conf/date/ImhofW14
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  persistent URL:
  - https://dblp.org/rec/conf/date/ImhofW14
Michael E. Imhof, Hans-Joachim Wunderlich:
Bit-Flipping Scan - A unified architecture for fault tolerance and offline test. DATE 2014: 1-6

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