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"A Novel Low-overhead Delay Testing Technique for Arbitrary Two-Pattern ..."
Swarup Bhunia et al. (2005)
- Swarup Bhunia, Hamid Mahmoodi-Meimand, Arijit Raychowdhury, Kaushik Roy:
A Novel Low-overhead Delay Testing Technique for Arbitrary Two-Pattern Test Application. DATE 2005: 1136-1141
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