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"Advances in Testing and Design-for-Test Solutions for M3D Integrated Circuits."

Sanmitra Banerjee et al. (2021)

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DOI: 10.23919/DATE51398.2021.9473921

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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  dblp key:
  - conf/date/BanerjeeCHC21
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  - https://dblp.org/rec/conf/date/BanerjeeCHC21
Sanmitra Banerjee, Arjun Chaudhuri, Shao-Chun Hung, Krishnendu Chakrabarty:
Advances in Testing and Design-for-Test Solutions for M3D Integrated Circuits. DATE 2021: 152-157

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