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"ECRIPSE: an efficient method for calculating RTN-induced failure ..."
Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato (2015)
- Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato:
ECRIPSE: an efficient method for calculating RTN-induced failure probability of an SRAM cell. DATE 2015: 549-554
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