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"Automated failure population creation for validating integrated circuit ..."

Wing Chiu Tam, Osei Poku, R. D. (Shawn) Blanton (2009)

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DOI: 10.1145/1629911.1630096

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Wing Chiu Tam, Osei Poku, R. D. (Shawn) Blanton:
Automated failure population creation for validating integrated circuit diagnosis methods. DAC 2009: 708-713

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