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"On tests to detect via opens in digital CMOS circuits."

Sudhakar M. Reddy, Irith Pomeranz, Chen Liu (2008)

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DOI: 10.1145/1391469.1391682

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  dblp key:
  - conf/dac/ReddyPL08
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  - https://dblp.org/rec/conf/dac/ReddyPL08
Sudhakar M. Reddy, Irith Pomeranz, Chen Liu:
On tests to detect via opens in digital CMOS circuits. DAC 2008: 840-845

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