"Enhancing test efficiency for delay fault testing using multiple-clocked ..."

Jing-Jia Liou et al. (2002)

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DOI: 10.1145/513918.514013

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  - conf/dac/LiouWCDMKW02
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Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams:
Enhancing test efficiency for delay fault testing using multiple-clocked schemes. DAC 2002: 371-374

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