"Efficient trimmed-sample Monte Carlo methodology and yield-aware design ..."

Chin-Cheng Kuo et al. (2012)

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DOI: 10.1145/2228360.2228563

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Chin-Cheng Kuo, Wei-Yi Hu, Yi-Hung Chen, Jui-Feng Kuan, Yi-Kan Cheng:
Efficient trimmed-sample Monte Carlo methodology and yield-aware design flow for analog circuits. DAC 2012: 1113-1118

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