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"Reliability-driven layout decompaction for electromigration failure ..."

Goeran Jerke, Jens Lienig, Jürgen Scheible (2004)

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DOI: 10.1145/996566.996618

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Goeran Jerke, Jens Lienig, Jürgen Scheible:
Reliability-driven layout decompaction for electromigration failure avoidance in complex mixed-signal IC designs. DAC 2004: 181-184

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