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"On Test Set Preservation of Retimed Circuits."

Aiman H. El-Maleh et al. (1995)

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DOI: 10.1145/217474.217526

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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  dblp key:
  - conf/dac/El-MalehMRM95
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  - https://dblp.org/rec/conf/dac/El-MalehMRM95
Aiman H. El-Maleh, Thomas E. Marchok, Janusz Rajski, Wojciech Maly:
On Test Set Preservation of Retimed Circuits. DAC 1995: 176-182

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