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"Resistive-open defect injection in SRAM core-cell: analysis and comparison ..."
Luigi Dilillo et al. (2005)
- Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
, Magali Bastian:
Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 µm and 90 nm technologies. DAC 2005: 857-862
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