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"Using introspective software-based testing for post-silicon debug and repair."

Kypros Constantinides, Todd M. Austin (2010)

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DOI: 10.1145/1837274.1837407

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  - conf/dac/ConstantinidesA10
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Kypros Constantinides, Todd M. Austin:
Using introspective software-based testing for post-silicon debug and repair. DAC 2010: 537-542

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