"LSI layout checking using bipolar device recognition technique."

C. S. Chang (1979)

> Home

Details and statistics

DOI: —

access: closed

type: Conference or Workshop Paper

metadata version: 2012-03-01

- view
  - electronic edition @ acm.org
- export record
  dblp key:
  - conf/dac/Chang79
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dac/Chang79
C. S. Chang:
LSI layout checking using bipolar device recognition technique. DAC 1979: 95-101

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.