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"Test Volume and Application Time Reduction Through Scan Chain Concealment."

Ismet Bayraktaroglu, Alex Orailoglu (2001)

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DOI: 10.1145/378239.378388

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  - conf/dac/BayraktarogluO01
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  - https://dblp.org/rec/conf/dac/BayraktarogluO01
Ismet Bayraktaroglu, Alex Orailoglu:
Test Volume and Application Time Reduction Through Scan Chain Concealment. DAC 2001: 151-155

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