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"A fully physical model for leakage distribution under process variations ..."

Hari Ananthan, Kaushik Roy (2006)

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DOI: 10.1145/1146909.1147020

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Hari Ananthan, Kaushik Roy:
A fully physical model for leakage distribution under process variations in Nanoscale double-gate CMOS. DAC 2006: 413-418

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