"An Integral Approach To Reuse Verification Code Towards Post Silicon Test ..."

Khim Hou Lee, Seow Pin Andy Chang (2008)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2009-02-10

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  - conf/csreaESA/LeeC08
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  - https://dblp.org/rec/conf/csreaESA/LeeC08
Khim Hou Lee, Seow Pin Andy Chang:
An Integral Approach To Reuse Verification Code Towards Post Silicon Test Pattern Generation Design Validation And Analysis For Effective SoC Product Development. ESA 2008: 214-220

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