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"Static Detection of Design Patterns in Class Diagrams."

Ed van Doorn, Sylvia Stuurman, Marko C. J. D. van Eekelen (2019)

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DOI: 10.1145/3375258.3375268

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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  dblp key:
  - conf/cserc/DoornSE19
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Ed van Doorn, Sylvia Stuurman, Marko C. J. D. van Eekelen:
Static Detection of Design Patterns in Class Diagrams. CSERC 2019: 79-88

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