"Critical points of the distance to an epsilon-sampling of a surface and ..."

Tamal K. Dey et al. (2005)

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DOI: 10.1145/1064092.1064126

access: closed

type: Conference or Workshop Paper

metadata version: 2021-06-14

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  dblp key:
  - conf/compgeom/DeyGRS05
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Tamal K. Dey, Joachim Giesen, Edgar A. Ramos, Bardia Sadri:
Critical points of the distance to an epsilon-sampling of a surface and flow-complex-based surface reconstruction. SCG 2005: 218-227

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