"ESL power analysis of embedded processors for temperature and reliability ..."

Björn Sander, Jürgen Schnerr, Oliver Bringmann (2009)

Details and statistics

DOI: 10.1145/1629435.1629469

access: closed

type: Conference or Workshop Paper

metadata version: 2019-03-29

a service of  Schloss Dagstuhl - Leibniz Center for Informatics