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"External Plagiarism Detection Based on Standard IR Technology and Fast ..."

Thomas Gottron (2010)

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DOI: —

access: open

type: Conference or Workshop Paper

metadata version: 2023-03-10

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  - electronic edition @ ceur-ws.org (open access)
  - electronic edition @ clef-initiative.eu (open access)
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  dblp key:
  - conf/clef/Gottron10
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  persistent URL:
  - https://dblp.org/rec/conf/clef/Gottron10
Thomas Gottron:
External Plagiarism Detection Based on Standard IR Technology and Fast Recognition of Common Subsequences - Lab Report for PAN at CLEF 2010. CLEF (Notebook Papers/LABs/Workshops) 2010

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