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"Family of low-cost NI ELVIS/LabVIEW-based semiconductor testers for ..."

Moi-Tin Chew et al. (2017)

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DOI: 10.1109/CIVEMSA.2017.7995320

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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Moi-Tin Chew, Serge Demidenko, Melanie Po-Leen Ooi, Ye Chow Kuang:
Family of low-cost NI ELVIS/LabVIEW-based semiconductor testers for engineering education. CIVEMSA 2017: 165-170

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