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"Predicting company failure-a comparison between neural networks and ..."

R. J. Van Eyden, P. W. C. De Wit, J. C. Arron (1995)

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DOI: 10.1109/CIFER.1995.495257

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-19

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R. J. Van Eyden, P. W. C. De Wit, J. C. Arron:
Predicting company failure-a comparison between neural networks and established statistical techniques by applying the McNemar test. CIFEr 1995: 91-96

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