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"Electrical Characteristic Fluctuations in Sub-45nm CMOS Devices."

Fu-Liang Yang, Jiunn-Ren Hwang, Yiming Li (2006)

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DOI: 10.1109/CICC.2006.320881

access: closed

type: Conference or Workshop Paper

metadata version: 2023-02-24

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Fu-Liang Yang, Jiunn-Ren Hwang, Yiming Li:
Electrical Characteristic Fluctuations in Sub-45nm CMOS Devices. CICC 2006: 691-694

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