"A deterministic scan-BIST architecture with application to field testing ..."

Shivakumar Swaminathan, Krishnendu Chakrabarty (2001)

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DOI: 10.1109/CICC.2001.929768

access: closed

type: Conference or Workshop Paper

metadata version: 2022-12-06

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Shivakumar Swaminathan, Krishnendu Chakrabarty:
A deterministic scan-BIST architecture with application to field testing of high-availability systems. CICC 2001: 259-262

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