"An integrated timing and dynamic supply noise verification for nano-meter ..."

Kenji Shimazaki et al. (2005)

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DOI: 10.1109/CICC.2005.1568600

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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Kenji Shimazaki, Mitsuya Fukazawa, Makoto Nagata, Shingo Miyahara, Masaaki Hirata, Kazuhiro Satoh, Hiroyuki Tsujikawa:
An integrated timing and dynamic supply noise verification for nano-meter CMOS SoC designs. CICC 2005: 31-34

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