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"Modeling well edge proximity effect on highly-scaled MOSFETs."
Yi-Ming Sheu et al. (2005)
- Yi-Ming Sheu, Ke-Wei Su, Sheng-Jier Yang, Hsien-Te Chen, Chih-Chiang Wang, Ming-Jer Chen, S. Liu:
Modeling well edge proximity effect on highly-scaled MOSFETs. CICC 2005: 831-834
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