


default search action
"Characterization of radiation-induced SRAM and logic soft errors from ..."
Robert Pawlowski et al. (2014)
- Robert Pawlowski, Joseph Crop, Minki Cho, James W. Tschanz, Vivek De, Thomas Fairbanks, Heather Quinn, Shekhar Borkar, Patrick Yin Chiang:
Characterization of radiation-induced SRAM and logic soft errors from 0.33V to 1.0V in 65nm CMOS. CICC 2014: 1-4

manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.