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"Analysis of SRAM neutron-induced errors based on the consideration of both ..."

Kenichi Osada et al. (2004)

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DOI: 10.1109/CICC.2004.1358820

access: closed

type: Conference or Workshop Paper

metadata version: 2017-08-21

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Kenichi Osada, Naoki Kitai, Shiro Kamohara, Takayuki Kawahara:
Analysis of SRAM neutron-induced errors based on the consideration of both charge-collection and parasitic-bipolar failure modes. CICC 2004: 357-360

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