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"Measurement results of delay degradation due to power supply noise well ..."

Yasuhiro Ogasahara et al. (2006)

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DOI: 10.1109/CICC.2006.320930

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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Yasuhiro Ogasahara, Takashi Enami, Masanori Hashimoto, Takashi Sato, Takao Onoye:
Measurement results of delay degradation due to power supply noise well correlated with full-chip simulation. CICC 2006: 861-864

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