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"Methodology of self-heating free parameter extraction and circuit ..."

Hajime Nakayama et al. (2001)

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DOI: 10.1109/CICC.2001.929805

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-10

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Hajime Nakayama, Pin Su, Chenming Hu, Motoaki Nakamura, Hiroshi Komatsu, Kaneyoshi Takeshita, Yasutoshi Komatsu:
Methodology of self-heating free parameter extraction and circuit simulation for SOI CMOS. CICC 2001: 381-384

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