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"RF simulations and physics of the channel noise parameters within MOS ..."

Tajinder Manku, Michael S. Obrecht, Yi Lin (1999)

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DOI: 10.1109/CICC.1999.777308

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-29

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Tajinder Manku, Michael S. Obrecht, Yi Lin:
RF simulations and physics of the channel noise parameters within MOS transistors. CICC 1999: 369-372

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