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"Modular test generation and concurrent transparency-based test translation ..."
Yiorgos Makris, Alex Orailoglu, Praveen Vishakantaiah (2000)
- Yiorgos Makris, Alex Orailoglu, Praveen Vishakantaiah:
Modular test generation and concurrent transparency-based test translation using gate-level ATPG. CICC 2000: 75-78
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