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"Characterization and analysis of gate-all-around Si nanowire transistors ..."
Ru Huang et al. (2011)
- Ru Huang, Runsheng Wang, Jing Zhuge, Changze Liu, Tao Yu, Liangliang Zhang, Xin Huang, Yujie Ai, Jinbin Zou, Yuchao Liu, Jiewen Fan, Huailin Liao, Yangyuan Wang:
Characterization and analysis of gate-all-around Si nanowire transistors for extreme scaling. CICC 2011: 1-8
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