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"Fast and accurate estimation of nano-scaled SRAM read failure probability ..."

Ik Joon Chang et al. (2005)

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DOI: 10.1109/CICC.2005.1568700

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Ik Joon Chang, Kunhyuk Kang, Saibal Mukhopadhyay, Chris H. Kim, Kaushik Roy:
Fast and accurate estimation of nano-scaled SRAM read failure probability using critical point sampling. CICC 2005: 439-442

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