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"Two New Metrics for Feature Selection in Pattern Recognition."
Pedro Y. Piñero et al. (2003)
- Pedro Y. Piñero, Leticia Arco, María M. García, Yaile Caballero, Raykenler Yzquierdo, Alfredo Morales:
Two New Metrics for Feature Selection in Pattern Recognition. CIARP 2003: 488-497
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