"Towards Big Data Visualization for Monitoring and Diagnostics of High ..."

Dimitra Gkorou et al. (2017)

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DOI: 10.1145/3075564.3078883

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Dimitra Gkorou, Alexander Ypma, George Tsirogiannis, Manuel Giollo, Dag Sonntag, Geert Vinken, Richard van Haren, Robert Jan van Wijk, Jelle Nije, Tom Hoogenboom:
Towards Big Data Visualization for Monitoring and Diagnostics of High Volume Semiconductor Manufacturing. Conf. Computing Frontiers 2017: 338-342

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