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"Estimation of Drain-Induced Barrier Lowering Variation Due to Random ..."

Weifeng Lyu et al. (2023)

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DOI: 10.3233/FAIA231196

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-31

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  - conf/cecnet/LyuHZWC23
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  - https://dblp.org/rec/conf/cecnet/LyuHZWC23
Weifeng Lyu, Ying Han, Caiyun Zhang, Weijie Wei, Dengke Chen:
Estimation of Drain-Induced Barrier Lowering Variation Due to Random Dopant Fluctuation Effect in Nanometer MOSFETs by Gamma Distribution. CECNet 2023: 215-223

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