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"Fault detection for single and multiple missing-gate faults in reversible ..."

Fangying Xiao et al. (2008)

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DOI: 10.1109/CEC.2008.4630787

access: closed

type: Conference or Workshop Paper

metadata version: 2018-08-07

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Fangying Xiao, Hanwu Chen, Wenjie Liu, Zhi-giang Li:
Fault detection for single and multiple missing-gate faults in reversible circuits. IEEE Congress on Evolutionary Computation 2008: 131-135

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