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"Maximizing functional test coverage in ASICs using evolutionary algorithms."

Burcin Aktan et al. (2001)

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DOI: 10.1109/CEC.2001.934387

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-08

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Burcin Aktan, Molly H. Shor, Garrison W. Greenwood, P. Doyle:
Maximizing functional test coverage in ASICs using evolutionary algorithms. CEC 2001: 178-182

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