"SEU tolerance of FinFET 6T SRAM, 8T SRAM and DICE memory cells."

Ahmed S. Sajit, Michael A. Turi (2017)

> Home

Details and statistics

DOI: 10.1109/CCWC.2017.7868477

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/ccwc/SajitT17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ccwc/SajitT17
Ahmed S. Sajit, Michael A. Turi:
SEU tolerance of FinFET 6T SRAM, 8T SRAM and DICE memory cells. CCWC 2017: 1-5

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.