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"MOSFET model assessment for submicron and nanometer bulk-driven applications."

Shaoxi Wang, Rui He, Lihong Zhang (2009)

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DOI: 10.1109/CCECE.2009.5090297

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Shaoxi Wang, Rui He, Lihong Zhang:
MOSFET model assessment for submicron and nanometer bulk-driven applications. CCECE 2009: 1091-1094

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