"Defect Detection from X-Ray Images Using A Three-Stage Deep Learning ..."

Jing Ren et al. (2019)

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DOI: 10.1109/CCECE.2019.8861944

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-05

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Jing Ren, Rui Ren, Mark Green, Xishi Huang:
Defect Detection from X-Ray Images Using A Three-Stage Deep Learning Algorithm. CCECE 2019: 1-4

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